Physical models for numerical simulation of Si-based nanoscale FETs and sensors

Silvestri, Luca (2011) Physical models for numerical simulation of Si-based nanoscale FETs and sensors, [Dissertation thesis], Alma Mater Studiorum Università di Bologna. Dottorato di ricerca in Tecnologie dell'informazione, 23 Ciclo. DOI 10.6092/unibo/amsdottorato/3731.
Documenti full-text disponibili:
[img]
Anteprima
Documento PDF (English) - Richiede un lettore di PDF come Xpdf o Adobe Acrobat Reader
Download (3MB) | Anteprima

Abstract

To continuously improve the performance of metal-oxide-semiconductor field-effect-transistors (MOSFETs), innovative device architectures, gate stack engineering and mobility enhancement techniques are under investigation. In this framework, new physics-based models for Technology Computer-Aided-Design (TCAD) simulation tools are needed to accurately predict the performance of upcoming nanoscale devices and to provide guidelines for their optimization. In this thesis, advanced physically-based mobility models for ultrathin body (UTB) devices with either planar or vertical architectures such as single-gate silicon-on-insulator (SOI) field-effect transistors (FETs), double-gate FETs, FinFETs and silicon nanowire FETs, integrating strain technology and high-κ gate stacks are presented. The effective mobility of the two-dimensional electron/hole gas in a UTB FETs channel is calculated taking into account its tensorial nature and the quantization effects. All the scattering events relevant for thin silicon films and for high-κ dielectrics and metal gates have been addressed and modeled for UTB FETs on differently oriented substrates. The effects of mechanical stress on (100) and (110) silicon band structures have been modeled for a generic stress configuration. Performance will also derive from heterogeneity, coming from the increasing diversity of functions integrated on complementary metal-oxide-semiconductor (CMOS) platforms. For example, new architectural concepts are of interest not only to extend the FET scaling process, but also to develop innovative sensor applications. Benefiting from properties like large surface-to-volume ratio and extreme sensitivity to surface modifications, silicon-nanowire-based sensors are gaining special attention in research. In this thesis, a comprehensive analysis of the physical effects playing a role in the detection of gas molecules is carried out by TCAD simulations combined with interface characterization techniques. The complex interaction of charge transport in silicon nanowires of different dimensions with interface trap states and remote charges is addressed to correctly reproduce experimental results of recently fabricated gas nanosensors.

Abstract
Tipologia del documento
Tesi di dottorato
Autore
Silvestri, Luca
Supervisore
Dottorato di ricerca
Scuola di dottorato
Scienze e ingegneria dell'informazione
Ciclo
23
Coordinatore
Settore disciplinare
Settore concorsuale
Parole chiave
crystal orientation gas detection mobility model silicon nanowires SOI MOSFETs ultrathin silicon
URN:NBN
DOI
10.6092/unibo/amsdottorato/3731
Data di discussione
15 Aprile 2011
URI

Altri metadati

Statistica sui download

Gestione del documento: Visualizza la tesi

^